The Surface Analyst XA applies the proven technology employed by the original handheld Surface Analyst to deposit a highly purified drop of water on a surface and then measure the contact angle. By automating this process, the XA increases the speed and efficiency by completing inspections on multiple surface points on a material surface at rates of up to 5,000 inspections per hour. As a result, the XA maps a surface across multiple points, ensuring the consistency and uniformity of surface quality on products ranging from the silicon wafers, electronic displays, critical medical device components to cast or machined metal parts and glass surfaces.
The XA measurement process is completely non-destructive. The unit uses highly-purified HPLC-grade water to prevent contamination of inspected material surfaces. Measurements are touchless, eliminating potential transfer of contamination from point to point on a surface. Being automated, the XA limits operator error or variation between inspections. Data capture and transfer to MES is automatic with the powerful Archer software, providing statistical process control as well as long-term trend analysis that monitors process drift.