DALLAS—The 26th annual International EOS/ESD Symposium will be held Sept. 19-23 at the Gaylord Texan Resort & Conference Center in Grapevine, TX.

Sponsored by the Electrostatic Discharge Association (Rome, NY), the symposium features more than 40 exhibitors and a comprehensive conference program.

Daniel L. Barton, Ph.D., a researcher at Sandia National Laboratories (Albuquerque, NM), is the keynote speaker. Dr. Barton will discuss new techniques for failure analysis in semiconductor manufacturing.

More than 50 papers, workshops and tutorials will be presented at the symposium, which is organized into three main tracks. The tracks are ESD Test, Failure Analysis and Systems; Factory, Material and ESD Control; and Device, Design and Technology.

For more information, call 315-339-6937 or visit www.esda.org/symposia.html.